A GRAPHICAL AID IN INDEXING POWDER DIFFRACTION PATTERNSMCLACHLAN D JR; HSI CHE LIN.1973; Z. KRISTALLOGR.; DTSCH.; DA. 1973; VOL. 137; NO 1; PP. 35-50; ABS. ALLEM.; BIBL. 12 REF.Serial Issue

OPTIMIZATION OF SCAN PROCEDURE FOR SINGLE-CRYSTAL X-RAY DIFFRACTION INTENSITIESKILLEAN RCG.1973; ACTA CRYSTALLOGR., A; DANEM.; DA. 1973; VOL. 29; NO 2; PP. 216-217; BIBL. 10 REF.Serial Issue

USE OF ASYMMETRIC DYNAMICAL DIFFRACTION OF X-RAYS FOR MULTIPLE-CRYSTAL ARRANGEMENTS OF THE (N₁,+N₂) SETTINGNAKAYAMA K; HASHIZUME H; MIYOSHI A et al.1973; Z. NATURFORSCH., A; DTSCH.; DA. 1973; VOL. 28; NO 5; PP. 632-638; BIBL. 25 REF.Serial Issue

METHODE DE DETERMINATION DE L'ORIENTATION D'UN CRISTAL, DE RESEAU CONNU, A PARTIR D'UN DIAGRAMME DE WEISSENBERG SANS CACHEMEYER P.1973; BULL. SOC. FR. MINERAL. CRISTALLOGR.; FR.; DA. 1973; VOL. 96; NO 1; PP. 72-73; BIBL. 2 REF.Serial Issue

THE OPTIMUM DISTRIBUTION OF COUNTING TIMES FOR DETERMINING INTEGRATED INTENSITIES WITH A DIFFRACTOMETERMACKENZIE JK; WILLIAMS EJ.1973; ACTA CRYSTALLOGR., A; DANEM.; DA. 1973; VOL. 29; NO 2; PP. 201-204; BIBL. 2 REF.Serial Issue

A SIMPLE EMPIRICAL ABSORPTION-CORRECTION METHOD FOR X-RAY INTENSITY DATA FILMSSCHWAGER P; BARTELS K; HUBER R et al.1973; ACTA CRYSTALLOGR., A; DANEM.; DA. 1973; VOL. 29; NO 3; PP. 291-295; BIBL. 10 REF.Serial Issue

ORIENTATION FACTORS FOR FIBER X-RAY DIFFRACTION DATA OBTAINED BY THE PRECESSION METHODMILLER DP; MURPHY VG.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 2; PP. 73-75; BIBL. 9 REF.Serial Issue

PRINCIPE D'UNE METHODE DIRECTE POUR DETERMINER L'ORIENTATION D'UN CRISTAL SUR UN DIFFRACTOMETREMERIGOUX H.1973; C.R. ACAD. SCI., B; FR.; DA. 1973; VOL. 276; NO 7; PP. 275-277; BIBL. 3 REF.Serial Issue

INTERNATIONAL UNION OF CRYSTALLOGRAPHY COMMISSION ON CRYSTALLOGRAPHIC APPARATUS SINGLE-CRYSTAL RADIATION DAMAGE SURVEYABRAHAMS SC.1973; ACTA CRYSTALLOGR., A; DANEM.; DA. 1973; VOL. 29; NO 2; PP. 111-116; BIBL. 8 REF.Serial Issue

SINGLE-CRYSTAL DIFFRACTOMETER DATA: THE ON-LINE CONTROL OF THE PRECISION OF INTENSITY MEASUREMENTSGRANT DF.1973; ACTA CRYSTALLOGR., A; DANEM.; DA. 1973; VOL. 29; NO 2; PP. 217; BIBL. 1 REF.Serial Issue

UNIT-CELL DIMENSION MEASUREMENTS FROM PAIRS OF X-RAY DIFFRACTION LINESPOPOVIC S.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 2; PP. 122-128; BIBL. 15 REF.Serial Issue

DETERMINATION OF THE STEREOGRAPHIC POLE FIGURES OF HEXAGONAL CRYSTALS WITHOUT PLOTTINGPROHASZKA J.1972; ACTA TECH. ACAD. SCI. HUNGAR.; HONGR.; DA. 1972; VOL. 73; NO 3-4; PP. 279-291; H.T. 1; ABS. ALLEM. RUSSE; BIBL. 4 REF.Serial Issue

GAUSSIAN PROFILE ANALYSIS IN COMPUTER CONTROLLED SINGLE CRYSTAL DIFFACTOMETRYNORRESTAM R.1972; ACTA CHEM. SCAND.; DANEM.; DA. 1972; VOL. 26; NO 8; PP. 3226-3234; BIBL. 11 REF.Serial Issue

INDEXATION DES DIAGRAMMES DE LAUE POUR DETERMINER LES AXES CRISTALLOGRAPHIQUES DE LA GLACEHIGASHI A; FUKUDA A; YAMANAKA Y et al.1972; LOW TEMPER. SCI., A; JAP.; DA. 1972; NO 30; PP. 35-46; H.T. 8; ABS. ANGL.; BIBL. 7 REF.Serial Issue

LIQUID STRUCTURE ANALYSIS BY ENERGY-SCANNING X-RAY DIFFRACTIONPROBER JM; SCHULTZ JM; SANDLER SI et al.1973; NATURE PHYS. SCI.; G.B.; DA. 1973; VOL. 243; NO 124; PP. 32-34; BIBL. 2 REF.Serial Issue

A NEW DIRECT METHOD FOR CHARACTERIZING STRUCTURES WITH STACKING FAULTS, BUILT UP FROM TRANSLATIONALLY EQUIVALENT LAYERS. II. FAULTS IN FIVE-LAYER STRUCTURE ELEMENTSFARKAS JAHNKE M.1973; ACTA CRYSTALLOGR., B; DANEM.; DA. 1973; VOL. 29; NO 3; PP. 413-420; BIBL. 4 REF.Serial Issue

TIME-SHARED COMPUTER ROUTINES FOR X-RAY LINE BROADENING ANALYSISNUNES TL; KIM JG; MENDIRATTA K et al.1972; J. APPL. CRYSTALLOGR.; DENM.; DA. 1972; VOL. 5; NO 6; PP. 389-394; BIBL. 15 REF.Serial Issue

COMPUTERIZATION OF RULAND'S X-RAY METHOD FOR DETERMINATION OF THE CRYSTALLINITY IN POLYMERSVONK CG.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 2; PP. 148-152; BIBL. 8 REF.Serial Issue

NOTE ON THE ABERRATIONS OF A FIXED-ANGLE ENERGY-DISPERSIVE POWDER DIFFRACTOMETERWILSON AJC.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 3; PP. 230-237; BIBL. 16 REF.Serial Issue

ON THE EFFECT OF MISALIGNMENT ON BRAGG ANGLES OBTAINED FROM ZERO-LAYER WEISSENBERG X-RAY PHOTOGRAPHSWADHAWAN VK.1973; INDIAN J. PHYS.; INDIA; DA. 1973; VOL. 47; NO 2; PP. 74-78; BIBL. 5 REF.Serial Issue

REDUCTION OF THE X-RAY INTENSITY EQUATION IN MATRIX FORM FOR ONE-DIMENSIONALLY DISORDERED STRUCTURESTAKAHASHI H.1973; ACTA CRYSTALLOGR., A; DANEM.; DA. 1973; VOL. 29; NO 2; PP. 215; BIBL. 6 REF.Serial Issue

THE PRECISION OF INTERPLANAR DISTANCES MEASURED BY AN ENERGY-DISPERSIVE DIFFRACTOMETERFUKAMACHI T; HOSOYA S; TERASAKI O et al.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 2; PP. 117-122; BIBL. 8 REF.Serial Issue

AN INCIDENT-BEAM IONIZATION CHAMBER AND CHARGE INTEGRATION SYSTEM FOR STABILIZATION OF X-RAY DIFFRACTION EXPERIMENTSHENDRICKS RW; DE LORENZO JT; GLASS FM et al.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 2; PP. 129-132; BIBL. 5 REF.Serial Issue

THE ACCURACY OF CELL DIMENSIONS DETERMINED BY COHEN'S METHOD OF LEAST SQUARES AND THE SYSTEMATIC INDEXING OF POWDER DATALANGFORD JI.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 3; PP. 190-196; BIBL. 11 REF.Serial Issue

THE ARCING OF X-RAY DIFFRACTION SPOTS IN X-RAY PHOTOGRAPHS FROM CADMIUM IODIDE CRYSTALSTIWARI RS; PRASAD R; SRIVASTAVA ON et al.1973; ACTA CRYSTALLOGR., A; DANEM.; DA. 1973; VOL. 29; NO 2; PP. 154-156; H.T. 1; BIBL. 15 REF.Serial Issue